Development of a Femtosecond Micromachining Workstation by Use of Spectral Interferometry

by Sudipta Bera et al. Optics Letters, 15 Feb 2005 A workstation that permits real-time measurement of ablation depth while micromachining with femtosecond laser pulses is demonstrated. This method incorporates the unamplified pulse train that is available in a chirped-pulse amplification system as the probe in an arrangement that uses spectral interferometry to measure the ablation depth while cutting with the amplified pulse in thin metal films. Read the article