Free Papers on RF Testing

Thirty free papers on RF testing are available online this month through the IEEE Communications Society's Tech Focus. Tech Focus provides sponsored access to papers from IEEE Communications Society magazines, journals, and conferences on rotating monthly topics. Articles this month include "High-Performance Carrier Interferometry OFDM WLANs", "A Low-Cost Test Solution for Wireless Phone RFICs", and "Structural RFIC Device Testing through Built-In Thermal Monitoring." Read more